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- W788700573 abstract "Coil structures have been designed to permit nondestructive testing of bubble wafers. Wafers can be electrically or optically inspected and operated from quasi-static frequency to maximum device operating frequency." @default.
- W788700573 created "2016-06-24" @default.
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- W788700573 date "1975-09-01" @default.
- W788700573 modified "2023-09-27" @default.
- W788700573 title "Bubble-domain circuit wafer evaluation coil set" @default.
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