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- W798813618 abstract "Theory of single-event upsets (SEU) (changes in logic state caused by energetic charged subatomic particles) in complementary metal oxide/semiconductor (CMOS) logic devices extended to provide upper-bound estimates of rates of SEU when limited experimental information available and configuration and dimensions of SEU-sensitive regions of devices unknown. Based partly on chord-length-distribution method." @default.
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- W798813618 date "1990-04-01" @default.
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- W798813618 title "Upper-Bound Estimates Of SEU in CMOS" @default.
- W798813618 hasPublicationYear "1990" @default.
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