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- W804949291 abstract "In SIMS work on organic materials samples are usually prepared under atmospheric conditions using aqueous or alcoholic solutions (e.g. dipping technique [1], electrospray [2], micropipette [3]). Major drawbacks of these methods are possible chemical reactions occuring between the target material and some components of the solution, and contaminations with e.g. hydrocarbons. Furthermore, it is not possible to produce well-defined substrate surfaces. Therefore, when investigating the influence of surface chemistry on secondary ion formation, it is necessary to perform sample preparation under UHV-conditions." @default.
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- W804949291 date "1982-01-01" @default.
- W804949291 modified "2023-10-05" @default.
- W804949291 title "Secondary Ion Emission from UHV-Deposited Amino Acid Overlayers on Clean Metal Surfaces" @default.
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- W804949291 doi "https://doi.org/10.1007/978-3-642-88152-7_65" @default.
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