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- W807565575 abstract "Memory system for computer repeatedly tests itself during brief, regular interruptions of normal processing of data. Detects and corrects transient faults as single-event upsets (changes in bits due to ionizing radiation) within milliseconds after occuring. Self-testing concept surpasses conventional by actively flushing latent defects out of memory and attempting to correct before accumulating beyond capacity for self-correction or detection. Cost of improvement modest increase in complexity of circuitry and operating time." @default.
- W807565575 created "2016-06-24" @default.
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- W807565575 date "1988-11-01" @default.
- W807565575 modified "2023-09-26" @default.
- W807565575 title "Self-Testing Computer Memory" @default.
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