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- W8651232 abstract "Fracture of Czochralski silicon wafers during processing is an important factor in solar cell yield and cost. A fracture-mechanics test and analysis program was developed to evaluate fracture strength changes in the in-process wafer-to-cell processing at different stages on a manufacturer's production line. The strength data were described by Weibull statistical analysis and can be interpreted with the surface-flaw distribution of each of the process steps." @default.
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- W8651232 date "1980-01-01" @default.
- W8651232 modified "2023-10-02" @default.
- W8651232 title "Effect of production processes on the fracture strength of silicon solar cells" @default.
- W8651232 hasPublicationYear "1980" @default.
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