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- W90690236 abstract "X-ray diffraction topography is a non-magnifying imaging method of comparatively poor spatial resolution and therefore confined to crystals of low defect density. Despite this restricting feature it has found wide-spread applications in various fields of research, in crystal processing and in the assessment of crystals for technical applications. Classic fields of applications are crystal growth and semiconductor processing for device production. In recent times it has proved to be an excellent method also for the study of phase transitions and the formation of (twin) domains." @default.
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- W90690236 date "1996-01-01" @default.
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- W90690236 title "X-Ray Diffraction Topography: Application to Crystal Growth and Plastic Deformation" @default.
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- W90690236 doi "https://doi.org/10.1007/978-1-4615-5879-8_10" @default.
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