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• W90849813 abstract "The new microscopy techniques for studying solid surfaces, scanning tunneling microscopy (STM) and atomic force microscopy (AFM), also offer possibilities of studying gaseous nano-voids at solid-water interfaces, i.e. cavitation nuclei. The use of STM presupposes that both the surface studied and that of the STM-tip allow electrons to be transferred to/from the location of tunneling. To detect surface nano-voids by STM it is therefore necessary that when the submerged STM-tip during scanning of a surface meets a void, the tunneling barrier is smaller along the cavity surface than if the tip moves on along the drained solid surface below the void. Likewise, the use of AFM for void detection presupposes that the liquid-gas interface of a void can supply a detectable force on the AFMtip. Otherwise, the tip will ignore the void, and only the solid surface below it will be detected. With both techniques it has proved possible to meet the demands for detection of surface nano-voids, and today their existence is well established. However, the results obtained depend on the technique of microscopy chosen, and on how it is applied, which makes the evaluation of such measurements difficult. Therefore, an analysis of the physics related to void detection by the scanning probe microscopy (SPM) techniques is important. The present paper presents this physics on the basis of experimental results obtained with SPM techniques since the early 1990’es. TECHNIQUES AND ANALYSIS Scanning tunneling microscopy Scanning tunneling microscopy [1] was the first of the SPM techniques to be developed, and therefore it was the one first used for comparison of specimen surfaces in air and in water in search of interfacial cavitation nuclei [2,3,4], originally suggested to exist by Harvey [5]. Specimens of gold (Au), vapour-deposited onto a lacquered aluminum substrate, specimen surfaces of titanium nitride (TiN), deposited onto a tungsten (W) substrate, and specimen surfaces of W were studied. It was revealed that in water the specimen surface topographies appeared notably smoother than in air, Figure 1, when scanned with sharp STM tips made from W. This was a first indication that interfacial voids are present in large numbers at fine roughness structures of submerged solid surfaces (lateral dimensions of up to about 200 nm), and that STM could be used to reveal their existence. But how could surface voids be imaged by STM? And, could the voids be observed by other techniques? Surface imaging by STM is based on a sharp, conducting STM tip being scanned along a conducting specimen surface at a constant tip-specimen distance s, in vacuum typically less than 1 nm, maintained by keeping a tunneling current It of a few nA in the tip-specimen gap constant by moving the tip up Figure 1. The same element of the surface of a W-specimen recorded with a W-tip (A) when submerged in water, and (B) subsequently in air. We notice the apparent smoothness of the surface in water compared with that in air. Also the tunnelling barrier signal is lower in air than in water because in air the tip is extremely close to the specimen surface, and the thin layers of adsorbed water molecules on their surfaces are in contact. It =4 nA [3]." @default.
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• W90849813 date "2009-08-01" @default.
• W90849813 modified "2023-09-25" @default.
• W90849813 title "Interfacial cavitation nuclei studied by scanning probe microscopy techniques" @default.
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