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- W949003048 abstract "Gold films of thicknesses 150-300 A were deposited on quartz substrata using vacuum evaporation technique. Spectrophotometric measurements of transmission T and reflection R at normal incidence were performed in the range 0.4-3.0 µm. The real and imaginary parts of the complex refractive index f.. were determined using a developer algorithm bashed on Murmann's exact equations. The accuracy in the determined n and k was found to be ±6.0% and ±1.6%, respectively. Tle dispersion curve of n slowed au anomalous dispersion in the visible region characterized by a peak at λ = 0.840 µm. The dielectric constants were calculated and presented. Tle Drude model parameters ' ι, and ω, and d.c. conductivity were determined and compared. The results showed that such parameters could be obtained from free-electron analysis for tle near 1R experimental results and the intraband transition contributes significantly to the dielectric functions." @default.
- W949003048 created "2016-06-24" @default.
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- W949003048 date "1994-09-01" @default.
- W949003048 modified "2023-10-17" @default.
- W949003048 title "Free-Electron Analysis of Optical Properties of Thermally Evaporated Gold Films" @default.
- W949003048 cites W2020098813 @default.
- W949003048 doi "https://doi.org/10.12693/aphyspola.86.375" @default.
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