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- W95778081 abstract "Electron microscopy was used to supplement metallographic studies of bonds between Zircaloy-2 interfaces. Treated surfaces before bonding, and bonded sections made by a variety of techniques were examined. Electron micrographs of belt-abraded surfaces exhibited a consistent fine-scale roughness. Chemically pickled surfaces were nearly smooth regardless of prior treatment. Chemically pickled samples and a zirconium oxide-coated sample pressure bonded at 1500 F and 10,000 psi had pitting at bond lines that could have been due to voids or to contaminant at the interface which etchod out. The pitting was almost completely eliminated in one sample by pressing one hour at 500 F and 350,000 psi. This indicated that the bond-line pitting in these samples was due to voids at the interface. Zircaloy-2 samples pressure bonded after coating with carbon chromium, iron nickel, or tin etched in relief along the bond line, indicating the presence of contaminant at the interface. On the basis of the present investigation, it is proposed that grain growth across the interface in chemically pickled samples may have been inhibited by the presence of a thin contaminant film originally present on the Zircaloy surfaces. However, the poor grain-growth characteristics of chemically pickled samples may also be due inmore » part to the surfaces being too smooth. (auth)« less" @default.
- W95778081 created "2016-06-24" @default.
- W95778081 creator A5023264667 @default.
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- W95778081 date "1959-07-29" @default.
- W95778081 modified "2023-09-27" @default.
- W95778081 title "ELECTRON MICROSCOPICAL EXAMINATION OF BONDS IN ZIRCALOY-2" @default.
- W95778081 doi "https://doi.org/10.2172/4212487" @default.
- W95778081 hasPublicationYear "1959" @default.
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