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- W965413612 abstract "1 前言 透射电子显微镜的研究工作能否顺利地达到预期目的,也就是说所观察的样品是否有足够的薄区并能反映大块材料中的微观结构和获得好的透射电镜照片,其关键就是能否具有好的透射电镜样品。因此,寻求理想的样品制备技术是至关重要的。 目前制备金属薄膜样品应用最广泛的是双喷电解抛光技术;对于脆性或非导电性质的材料多应用离子减薄技术,本文就此两顶技术讨论如下。" @default.
- W965413612 created "2016-06-24" @default.
- W965413612 creator A5011799367 @default.
- W965413612 date "1995-02-15" @default.
- W965413612 modified "2023-09-23" @default.
- W965413612 title "透射电子显微镜样品制备技术(一)——薄膜样品制备技术" @default.
- W965413612 hasPublicationYear "1995" @default.
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