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- W981738124 abstract "An analysis technique combining RBS with PIXE technology by x-particles incident beam was constructedand applied to analyse light impurities in heavier substrates.It can run in measuring Rutherford backscatteringand X-ray spectra in random and channeling mode,simultaneously.Being used to analyse..." @default.
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- W981738124 date "1992-01-01" @default.
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- W981738124 title "Application of Combined α-RBS and PIXE Analysis Technology" @default.
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